Gate-sensing Overcurrent Protection Scheme for GaN Transistors.
The Problem
Power converters using wide bandgap field effect transistors run the risk of overcurrent, which can cause overheating and even damage the device. In addition to overcurrent, conventional power converts fail to optimally regulate gate voltage throughout the circuit’s use, leading to inefficiencies.
The Solution
Researchers at the University of Tennessee have developed a power converter circuit using wide bandgap FETs which employs a control mechanism that measures drain current to regulate gate voltage. This mechanism can be used to optimize the gate voltage as well as protect the transistor from overcurrent damages by quickly turning off the GaN transistor. This technology is ideal for power converters in high frequency, and high-power applications.
Benefits
| Benefit |
|---|
| No drain-side sensing diode: no added capacitive load; negligible switching loss impact |
| Gate-voltage-based sensing: temperature independent and flexible threshold settings |
| ~60 ns response times; fast enough for GaN’s high fault current slew rates |
| Soft turn-off: prevents overvoltage destruction during fault shutdown |
| Flexible topology support – works with Buck, Boost, Buck-Boost, SEPIC, Zeta, AC/DC, DC/AC converters |
More Information
- Gregory Sechrist
- Technology Manager
- 865-974-1882 | gsechris@tennessee.edu
- UTRF Reference ID: 18038
- Patent Status: US 11,705,720
Innovators
Dr. Fei "Fred" Wang
Professor and Condra Chair of Excellence in Power Electronics, Min H. Kao Department of Electrical Engineering and Computer Science, UT Knoxville
Dr. Wang holds the Condra Chair of Excellence in Power Electronics and is a Professor in Electrical Engineering at The University of Tennessee. He is a founding member and the Technical Director of the NSF-DOE Engineering Research Center CURENT. He is conducting research on: design, modeling, control, and integration of advanced power electronics converters; motor drives; wide bandgap device characterization, modeling, packaging, control, and application; power electronics application to...
Read more about Dr. Fei "Fred" Wang